| /** \file vp_api_test.h |
| * file vp_api_test.h |
| * |
| * This file contains declaration associated with VP-API Test features. |
| * |
| * Copyright (c) 2010, Zarlink Semiconductor, Inc. |
| * |
| * $Revision: 7301 $ |
| * $LastChangedDate: 2010-06-08 14:43:02 -0500 (Tue, 08 Jun 2010) $ |
| */ |
| |
| #ifndef VP_API_TEST_H |
| #define VP_API_TEST_H |
| |
| #include "vp_api_types.h" |
| #include "vp_api_option.h" |
| #include "vp_api_event.h" /* For VpDigitType */ |
| |
| #define VP_TEST_NOT_MEASURED 0x8000 /* a value of -1 to indicate not measured */ |
| /* chosen because it is an impermissible value in those tests where used */ |
| |
| /** Tests supported by VpTestLine function */ |
| typedef enum |
| { |
| VP_TEST_ID_PREPARE = 0x00, /* Prepare for a test sequence */ |
| VP_TEST_ID_CONCLUDE = 0x01, /* Conclude a test sequence */ |
| VP_TEST_ID_SET_SENSE_GAIN = 0x02, /* Set ILG and IMT gains high or low */ |
| VP_TEST_ID_OPEN_VDC = 0x03, /* Measure open DC voltage */ |
| VP_TEST_ID_OPEN_VAC = 0x04, /* Measure open AC voltage */ |
| VP_TEST_ID_DIFF_VAC = 0x05, /* Measure differential AC voltage */ |
| VP_TEST_ID_DC_RLOOP = 0x06, /* Measure DC loop resistance */ |
| VP_TEST_ID_AC_RLOOP = 0x07, /* Measure AC loop impedance */ |
| VP_TEST_ID_NULL_IGND = 0x08, /* Null ground current */ |
| VP_TEST_ID_3ELE_RES = 0x09, /* Measure 3-element insulation resistance */ |
| VP_TEST_ID_3ELE_CAP = 0x0A, /* Measure 3-element capacitance */ |
| VP_TEST_ID_IDC = 0x0B, /* Measure DC currents */ |
| VP_TEST_ID_IAC = 0x0C, /* Measure AC currents */ |
| VP_TEST_ID_KEYPAD = 0x0D, /* Keypad DTMF and Pulse dial test */ |
| VP_TEST_ID_NOISE = 0x0E, /* Measure Active or Passive Noise 3, 3.4 & 15KhZ */ |
| VP_TEST_ID_SNR_QDIST = 0x0F, /* Measure SNR and quantization distortion */ |
| VP_TEST_ID_ARB_1TONE = 0x10, /* Measure arbitrary single tone */ |
| VP_TEST_ID_TONE_GEN = 0x11, /* Generate a single/dual/quad-tone */ |
| VP_TEST_ID_DIALTONE = 0x12, /* Detect and measure dial tone (Inward test) */ |
| VP_TEST_ID_HYBRID_LOSS = 0x13, /* Measure trans-hybrid loss */ |
| VP_TEST_ID_ALT_REN = 0x14, /* Alternative method used to measure REN */ |
| VP_TEST_ID_HOOK_STATUS = 0x15, /* Check Hook Status (while in test mode) */ |
| VP_TEST_ID_PCM_COLLECT = 0x16, /* Collect PCM samples */ |
| VP_TEST_ID_AC_RLOOP_PHASE = 0x17, /* Rloop with Phase information */ |
| VP_TEST_ID_SET_BATTERIES = 0x18, /* Select batteries for line testing */ |
| VP_TEST_ID_MONITOR_IV = 0x19, /* Non-Intrusive Monitoring Test */ |
| VP_TEST_ID_UNBAL_TONE = 0x1A, /* Generates an unbalanced tracing tone */ |
| VP_TEST_ID_3ELE_RES_VMID = 0x1B, /* Measure 3-element insulation resistance with a specified vMid */ |
| VP_TEST_ID_AC_TRANS = 0x1C, /* Measures digital-digital transmission characteristics */ |
| VP_TEST_ID_GEN_TEST = 0x1D, /* Multi-functional primitive */ |
| VP_TEST_ID_SLOPE_REN = 0x1E, /* REN test with a ramp instead of step */ |
| /* Test IDs above this line are supported by one or more VCP devices. |
| Their values must not change. More VCP tests might be added above this |
| line in the future. */ |
| |
| VP_TEST_ID_RSVD_MIN = 0x23, /* Custom VCP tests (not currently used) */ |
| VP_TEST_ID_RSVD_MAX = 0x23, |
| |
| /* The values of the constants below this line can change from time. */ |
| |
| VP_TEST_ID_3ELE_RES_HG, /* Alternative 3-element resistance high gain */ |
| VP_TEST_ID_3ELE_RES_LG, /* Alternative 3-element resistance low gain */ |
| VP_TEST_ID_3ELE_CAP_CSLAC, /* CSLAC 3-element capacitance test */ |
| VP_TEST_ID_MSOCKET_TYPE2, /* Master Socket test for UK termination */ |
| VP_TEST_ID_XCONNECT, /* Cross Connect detection test */ |
| VP_TEST_ID_LOOP_CONDITIONS, /* Measure current loop conditions */ |
| VP_TEST_ID_LOOPBACK, /* Setup loopback conditions */ |
| VP_TEST_ID_LINE_IMPD, /* Measure impedance at a frequency */ |
| VP_TEST_ID_RING_TRIP, /* Test ability to detect ring trip */ |
| VP_TEST_ID_LOOP_DETECT, /* Test ability to source current and detect |
| * off-hook */ |
| VP_TEST_ID_CALIBRATE, /* Perform line calibration */ |
| VP_TEST_ID_USE_LINE_CAL, /* Copy dev cal factors from lineObj to devObj */ |
| VP_TEST_ID_OPEN_VXC, /* Measure both DC and AC voltages */ |
| |
| VP_TEST_ID_GR909_HEMF, /* Hazardous Potential Voltage Test for AC/DC |
| * Tip and Ring */ |
| VP_TEST_ID_GR909_EMF, /* FEMF test for AC/DC Tip and Ring */ |
| VP_TEST_ID_GR909_RES_FLT, /* Resistive Faults (T/R, T-Gnd, R-Gnd) */ |
| VP_TEST_ID_GR909_OFF_HOOK, /* Receiver Off-Hook */ |
| VP_TEST_ID_GR909_RINGERS, /* REN per FCC part 68 (1REN = 7Kohm) */ |
| VP_TEST_ID_GR909_ALL, /* Run all GR909 tests */ |
| VP_TEST_ID_DELAY, /* Implements non-blocking delay */ |
| VP_TEST_ID_RAMP_INIT, /* Implements a ramp to voltage test init */ |
| VP_TEST_ID_RAMP, /* Implements a ramp to voltage test */ |
| VP_TEST_ID_FLT_DSCRM, /* Implements the Fault discrimination test (880 890 only)*/ |
| VP_TEST_ID_PREPARE_EXT, /* Prepare for a test sequence without modifying the low power state */ |
| |
| VP_TEST_ID_SET_SENSE_GAIN_792, /* Set Low/Normal/High sense gain for VCP792. |
| * The API translates this to the value of |
| * VP_TEST_ID_SET_SENSE_GAIN before sending |
| * it down to the VCP. */ |
| |
| VP_NUM_TEST_IDS, |
| |
| VP_TEST_ID_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestIdType; |
| |
| /**< The following are test line error codes */ |
| typedef enum { |
| VP_TEST_STATUS_SUCCESS = 0, /**< Test Completed Successfully */ |
| VP_TEST_STATUS_LINE_NOT_READY = 1, /**< Line Not in Test-mode (no VP_TEST_ID_PREPARE) */ |
| VP_TEST_STATUS_RESOURCE_NA = 2, /**< Line Not available for Test (already in Test) */ |
| VP_TEST_STATUS_TESTING = 3, /**< Test underway - not aborted */ |
| VP_TEST_STATUS_VOUT_OOR = 4, /**< Voltage Out-of-range */ |
| VP_TEST_STATUS_VAB_OOR = 5, /**< A-B Voltage is out-of-range */ |
| VP_TEST_STATUS_ILG_OOR = 6, /**< Measured IILG is out-of-range */ |
| VP_TEST_STATUS_VCM_OOR = 7, /**< Measured VCM is out-of-range */ |
| VP_TEST_STATUS_IAHL_OOR = 8, /**< Measured current or voltage is out-of-range in Res or Cap test */ |
| VP_TEST_STATUS_IBHL_OOR = 9, /**< " " */ |
| VP_TEST_STATUS_IAHH_OOR = 10, /**< " " */ |
| VP_TEST_STATUS_IBHH_OOR = 11, /**< " " */ |
| VP_TEST_STATUS_VABHL_OOR = 12, /**< " " */ |
| VP_TEST_STATUS_IALL_OOR = 13, /**< " " */ |
| VP_TEST_STATUS_IBLL_OOR = 14, /**< " " */ |
| VP_TEST_STATUS_IA_OOR = 15, /**< Measured Current is out-of-range */ |
| VP_TEST_STATUS_IB_OOR = 16, /**< " " */ |
| VP_TEST_STATUS_IMT_OOR = 17, /**< Measured IMT is out-of-range */ |
| VP_TEST_STATUS_IMT_DC_OOR = 18, /**< " " */ |
| VP_TEST_STATUS_15KHZ_ERROR = 19, /**< More than 1 15Khz Test requested */ |
| VP_TEST_STATUS_TIMEOUT = 20, /**< Failed to complete in specified time */ |
| VP_TEST_STATUS_ABORTED = 21, /**< Test aborted */ |
| VP_TEST_STATUS_INTERNAL_ERROR = 22, /**< Internal error (SLAC integrator) */ |
| VP_TEST_STATUS_NO_CONVERGENCE = 23, /**< NULL_IGND test failed to converge */ |
| VP_TEST_STATUS_TEST_NOT_SUPPORTED = 24, /**< Requested test is not supported (due to device configuration) */ |
| VP_TEST_STATUS_VTIPBIAS_OOR = 25, /**< Tip Bias Voltage Out of Range */ |
| VP_TEST_STATUS_VRINGBIAS_OOR = 26, /**< Ring Bias Voltage Out of Range */ |
| VP_TEST_STATUS_VMID_OOR = 27, /**< User specified vMid voltage is out of range */ |
| VP_TEST_STATUS_GAIN_OOR = 28, /**< User specified gain is out of range */ |
| VP_TEST_STATUS_VA_OOR = 29, /**< Measured Voltage is out-of-range */ |
| VP_TEST_STATUS_VB_OOR = 30, /**< " " */ |
| VP_TEST_STATUS_IMTOFFSET_OOR = 31, |
| VP_TEST_STATUS_BUF_OVERFLOW = 32, /* test would exceed the buffer storage available */ |
| VP_TEST_STATUS_NUM_TYPES, /**< NOT an ERROR, Just used for coding purposes */ |
| VP_TEST_STATUS_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestStatusType; |
| |
| typedef struct { |
| uint16 gMvErr; |
| int16 gMvOff; |
| uint16 gLvErr; |
| int16 gLvOff; |
| uint16 gMiErr; |
| int16 gMiOff; |
| uint16 gLiErr; |
| int16 gLiOff; |
| uint16 sAvErr; |
| int16 sAvOff; |
| uint16 sAiErr; |
| int16 sAiOff; |
| uint16 sBvErr; |
| int16 sBvOff; |
| uint16 sBiErr; |
| int16 sBiOff; |
| |
| uint16 sABMvErr; |
| int16 sABMvOff; |
| uint16 sABMiErr; |
| int16 sABMiOff; |
| |
| uint16 sABLvErr; |
| int16 sABLvOff; |
| uint16 sABLiErr; |
| int16 sABLiOff; |
| |
| uint16 sABMHiErr; |
| int16 sABMHiOff; |
| uint16 sABLHiErr; |
| int16 sABLHiOff; |
| } VpTestCalibrationDataType; |
| |
| /* Definitions used for VP_TEST_ID_DELAY */ |
| typedef struct { |
| uint16 timerVal; /* Value in 125uS steps */ |
| } VpTestTimerType; |
| |
| /* Definitions used for VP_TEST_ID_CONCLUDE */ |
| typedef struct { |
| bool abortTest; |
| } VpTestConcludeType; |
| |
| /* Definitions used for VP_TEST_ID_SET_SENSE_GAIN */ |
| typedef enum { |
| VP_SENSE_GAIN_HIGH = 0, |
| VP_SENSE_GAIN_LOW = 1, |
| VP_SENSE_GAIN_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpSenseGainType; |
| |
| typedef struct { |
| VpSenseGainType imt; |
| VpSenseGainType ilg; |
| } VpTestSetSenseGainType; |
| |
| /* 792-specific definitions for VP_TEST_ID_SET_SENSE_GAIN_VP792 */ |
| typedef enum { |
| VP792_SENSE_GAIN_0dB_GAIN = 0x0000, /* absolute gain = 1 */ |
| VP792_SENSE_GAIN_28dB_GAIN = 0x0010, /* absolute gain = 25 */ |
| VP792_SENSE_GAIN_10dB_LOSS = 0x0020, /* absolute gain = 1/3 */ |
| VP792_SENSE_GAIN_RSVD = 0x0030, |
| VP792_SENSE_GAIN_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } Vp792SenseGainType; |
| |
| typedef struct { |
| Vp792SenseGainType senseGain; |
| } VpTestSet792SenseGainType; |
| |
| /* Definitions used for VP_TEST_ID_SET_BATTERIES */ |
| typedef enum { |
| VP_BS_LOW = 0, |
| VP_BS_HIGH = 1, |
| VP_BS_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpSetBatteriesType; |
| |
| typedef struct { |
| VpSetBatteriesType bs1; |
| VpSetBatteriesType bs0; |
| } VpTestSetBatteriesType; |
| |
| /* Definitions used for VP_TEST_ID_OPEN_VDC, VP_TEST_ID_OPEN_VAC */ |
| typedef enum { |
| VP_TEST_RING = 0, |
| VP_TEST_TIP = 1, |
| VP_TEST_TIP_RING = 2, |
| VP_TEST_TIP_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestTipSelectType; |
| |
| typedef struct { |
| bool calMode; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpTestTipSelectType tip; |
| } VpTestOpenVType; |
| |
| /* Definitions used for VP_TEST_ID_DIFF_VAC */ |
| typedef struct { |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| int16 gvsaCal; |
| int16 gvsbCal; |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestDiffVacType; |
| |
| /* Definitions used for VP_TEST_IDC, VP_TEST_IAC */ |
| typedef struct { |
| bool calMode; |
| int16 vCm; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestIdcType; |
| |
| typedef struct { |
| int16 gimtCal; |
| int16 gilgCal; |
| int16 vCm; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestIacType; |
| |
| typedef struct { |
| int16 ia; |
| int16 ib; |
| } VpTestResultVixType; |
| |
| /* Definitions used for VP_TEST_ID_DC_RLOOP */ |
| typedef struct { |
| bool calMode; |
| int16 iTestLevel; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestDcRLoopType; |
| |
| typedef struct { |
| int16 vab; |
| int16 ilg; |
| bool currentSaturation; |
| } VpTestResultDcRlType; |
| |
| /* Definitions used for VP_TEST_ID_AC_RLOOP */ |
| typedef struct { |
| bool calMode; |
| uint16 freq; |
| int16 vTestLevel; |
| int16 vBias; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpTestTipSelectType tip; /* Used by VE880 only */ |
| } VpTestAcRLoopType; |
| |
| typedef struct { |
| int16 imt; |
| int16 ilg; |
| int16 vab; |
| int32 freq; |
| } VpTestResultAcRlType; |
| |
| /* Definition used for VP_TEST_ID_AC_RLOOP_PHASE (in addition to VpTestAcRLoopType) */ |
| typedef struct { |
| int16 imt; |
| int16 ilg; |
| int16 phase; |
| } VpTestResultAcRlPhaseType; |
| |
| /* Definitions used for VP_TEST_ID_LOOP_COND */ |
| typedef enum { |
| VP_LOOP_COND_TEST_VSAB = 1, |
| VP_LOOP_COND_TEST_VSAG = 2, |
| VP_LOOP_COND_TEST_VSBG = 3, |
| VP_LOOP_COND_TEST_RLOOP = 4, |
| VP_LOOP_COND_TEST_ILG = 5, |
| VP_LOOP_COND_TEST_IMT = 6, |
| VP_LOOP_COND_TEST_BAT1 = 7, |
| VP_LOOP_COND_TEST_BAT2 = 8, |
| VP_LOOP_COND_TEST_BAT3 = 9, |
| VP_LOOP_COND_TEST_METER = 10, |
| VP_LOOP_COND_TEST_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpLoopCondTestType; |
| |
| typedef struct { |
| bool calMode; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpLoopCondTestType loopCond; /* Indicates which condition to measure */ |
| } VpTestLoopCondType; |
| |
| typedef struct { |
| VpLoopCondTestType condition; |
| int16 data; |
| bool calibrated; |
| int16 limit; /* Limit or target value */ |
| } VpTestResultLoopCondType; |
| |
| /* Definitions used for VP_TEST_ID_XCONNECT */ |
| typedef enum { |
| VP_XCONNECT_DISC_V = 0, |
| VP_XCONNECT_12VVOC_I = 1, |
| VP_XCONNECT_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpXConnectType; |
| |
| typedef struct { |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpXConnectType measReq; /* Indicates which measurement sequence to run */ |
| bool isFeedPositive; /* VP_XCONNECT_12VVOC_I feed sign depends on measured EMF */ |
| uint8 phase; /* Test phase number */ |
| } VpTestXConnectType; |
| |
| typedef struct { |
| VpXConnectType condition; |
| int16 data; |
| } VpTestResultXConnectType; |
| |
| /* Definitions used for VP_TEST_ID_LOOPBACK */ |
| typedef enum { |
| VP_LOOPBACK_TEST_CODEC = 1, |
| VP_LOOPBACK_TEST_ANALOG = 2, |
| VP_LOOPBACK_TEST_BFILTER = 3, |
| VP_LOOPBACK_TEST_TIMESLOT = 4, |
| VP_LOOPBACK_TEST_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpLoopbackTestType; |
| |
| typedef struct { |
| uint16 waitTime; /* Indicates how long before collecting samples */ |
| uint16 loopbackTime; /* Indicates Loopback duration in units of 125us */ |
| VpLoopbackTestType loopback;/* Indicates which condition to setup */ |
| } VpTestLoopbackType; |
| |
| typedef struct { |
| VpLoopbackTestType loopback; /* Indicates which condition was setup*/ |
| void *pApplicationInfo; |
| } VPTestResultLoopbackType; |
| |
| /* Definitions used for VP_TEST_LINE_IMPD */ |
| typedef struct { |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| bool filterMode; |
| int16 vcm; /* Common mode voltage for measurement */ |
| int16 vDiff; /* Differential voltage for measurement */ |
| uint16 freq; |
| int16 amp; |
| } VpTestLineImpdType; |
| |
| typedef struct { |
| bool iaOor; /* If set IA out of range */ |
| bool ibOor; /* If set IB out of range */ |
| uint16 iDiff; /* RMS differential current */ |
| } VpTestResultLineImpdType; |
| |
| /**< Typedefs for Advanced Tests */ |
| /* Definitions used for VP_TEST_TONE_GEN */ |
| typedef struct { |
| uint16 duration; |
| uint16 freq1; |
| int16 amp1; |
| uint16 freq2; |
| int16 amp2; |
| uint16 freq3; |
| int16 amp3; |
| uint16 freq4; |
| int16 amp4; |
| } VpTestToneGenType; |
| |
| /* Definitions used for VP_TEST_ALT_REN */ |
| typedef struct { |
| uint16 integrateTime; |
| int16 vDiff; |
| } VpTestRenType; |
| |
| typedef struct { |
| int16 imt; |
| int16 imtDc; |
| } VpTestResultRenType; |
| |
| /* Definitions used for VP_TEST_ID_SLOPE_REN */ |
| typedef enum { |
| VP_TEST_TYPE_UNDEFINED = 0, |
| VP_TEST_TYPE_AVG = 1, |
| VP_TEST_TYPE_RMS = 2, |
| VP_TEST_TYPE_DFT = 3, |
| VP_TEST_TYPE_RAW = 4, |
| VP_TEST_TYPE_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestMathType; |
| |
| typedef enum { |
| VP_TEST_SPEED_UNDEFINED = 0, |
| VP_TEST_SPEED_LOW = 1, |
| VP_TEST_SPEED_MED = 2, |
| VP_TEST_SPEED_HIGH = 3, |
| VP_TEST_SPEED_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestDcbwSpeedType; |
| |
| typedef struct { |
| uint16 slopeTime; |
| uint16 integrateTime; |
| uint16 settlingTime; |
| int16 vDiff; |
| VpTestMathType type; |
| VpTestDcbwSpeedType speed; |
| } VpTestSRenType; |
| |
| typedef struct { |
| int16 imtOffset; |
| int16 imt; |
| int16 imtDc; |
| } VpTestResultSRenType; |
| |
| /* Definitions used for VP_TEST_ID_3ELE_RES*/ |
| typedef struct { |
| bool calMode; |
| int16 vCm; |
| int16 vDiff; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestResType; |
| |
| typedef struct { |
| int16 iahl; |
| int16 ibhl; |
| int16 iahh; |
| int16 ibhh; |
| int16 iall; |
| int16 ibll; |
| int16 vabhl; |
| } VpTestResultResType; |
| |
| /* Definition used for VP_TEST_ID_3ELE_HG and LG */ |
| typedef struct { |
| int16 feedBias; |
| bool shiftZeroFeed; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTest3EleResAltResType; |
| |
| typedef struct { |
| bool highGain; |
| int16 vanf; |
| int16 vbnf; |
| int16 imnf; |
| int16 ilnf; |
| int16 varf; |
| int16 vbrf; |
| int16 imrf; |
| int16 ilrf; |
| int16 vazf; |
| int16 vbzf; |
| int16 imzf; |
| int16 ilzf; |
| } VpTestResultAltResType; |
| |
| /* Definition used for VP_TEST_ID_MSOCKET_TYPE2 */ |
| typedef struct { |
| uint8 dummy; |
| } VpTestMSocketType; |
| |
| typedef struct { |
| int16 vanf; |
| int16 vbnf; |
| int16 imnf; |
| int16 varf1; |
| int16 vbrf1; |
| int16 imrf1; |
| int16 varf2; |
| int16 vbrf2; |
| int16 imrf2; |
| int16 varf3; |
| int16 vbrf3; |
| int16 imrf3; |
| } VpTestResultMSockType; |
| |
| /* Definition used for VP_TEST_ID_3ELE_CAP_CSLAC */ |
| typedef struct { |
| bool calMode; /* Enable calibration */ |
| uint16 testAmp; /* Test signal amplitude (mV RMS) */ |
| uint8 testFreq; /* Test signal frequency [0,4], 0=2666.016Hz -> 4=280.151Hz */ |
| int16 bias; /* Signal generator bias (V) */ |
| } VpTest3EleCapAltResType; |
| |
| typedef struct { |
| bool accuracyFlag; |
| uint8 freq; |
| int16 va; |
| int16 vb; |
| int16 im; |
| int16 il; |
| int32 tipCapCal; |
| int32 ringCapCal; |
| } VpTestResultAltCapType; |
| |
| /* Definition used for VP_TEST_ID_3ELE_RES_VMID */ |
| typedef struct { |
| bool calMode; |
| int16 vCm; |
| int16 vDiff; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| int16 vMid; |
| } VpTestResVmidType; |
| |
| typedef struct { |
| int16 vdc; |
| int16 vac; |
| } VpTestResultVxcType; |
| |
| /* Definitions used for VP_TEST_3ELE_CAP */ |
| typedef struct { |
| bool calMode; |
| int16 vCm; |
| int16 vDiff; |
| uint16 freq; |
| int16 gimtCal; |
| int16 gilgCal; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| } VpTestCapType; |
| |
| typedef struct { |
| int16 iahl; |
| int16 iahh; |
| int16 ibhh; |
| int16 iall; |
| int16 ibll; |
| int16 vabhl; |
| } VpTestResultCapType; |
| |
| /* Definitions used for VP_TEST_NOISE */ |
| typedef enum { |
| VP_FILTER_NONE = 0, |
| VP_FILTER_3KHZ = 1, |
| VP_FILTER_CMSG = 2, |
| VP_FILTER_15KHZ = 3, |
| VP_FILTER_3_4KHZ = 4, |
| VP_FILTER_D = 5, |
| VP_FILTER_PSOPH = 6, |
| VP_NUM_TEST_FILTER_TYPES, |
| VP_FILTER_ENUM_RSVD = FORCE_SIGNED_ENUM, |
| VP_FILTER_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestFilterType; |
| |
| typedef struct { |
| uint16 integrateTime; |
| VpTestFilterType filter; |
| int16 amp; |
| bool useBuffer; |
| } VpTestNoiseType; |
| |
| /* Definitions used for VP_TEST_HYBRID_LOSS */ |
| typedef struct { |
| uint16 integrateTime; |
| uint16 freq; |
| int16 amp; |
| bool useBuffer; |
| } VpTestTransHybridLossType; |
| |
| /* Definitions used for VP_TEST_ID_NULL_IGND */ |
| typedef struct { |
| int16 vTestLevel; |
| int16 iTarget; |
| VpTestTipSelectType tip; |
| uint16 settlingTime; |
| } VpTestNullIGndType; |
| |
| /* Definitions used for VP_TEST_KEYPAD */ |
| typedef enum { |
| VP_KEY_TEST_DTMF = 0, |
| VP_KEY_TEST_PULSE = 1, |
| VP_KEY_TEST_BOTH = 2, |
| VP_NUM_KEY_TEST_TYPES, |
| VP_KEY_TEST_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpKeyTestType; |
| |
| typedef struct { |
| VpKeyTestType kTest; |
| uint16 timeout; |
| uint16 freq; |
| int16 amp; |
| uint16 fftSize; |
| uint16 threshold; |
| VpOptionPulseType pulseOpt; |
| bool useBuffer; |
| } VpTestKeypadType; |
| |
| typedef enum { |
| VP_KT_DTMF_DET = 0, |
| VP_KT_DTMF_MES = 1, |
| VP_KT_PULSE = 2, |
| VP_KT_THRESH_DET = 3, |
| VP_NUM_KT_TYPES, |
| VP_KT_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpKeyTestResultType; |
| |
| typedef struct { |
| VpKeyTestResultType kTestResult; |
| VpDigitType digit; |
| uint16 lowFreq; |
| uint16 lowAmp; |
| uint16 highFreq; |
| uint16 highAmp; |
| uint16 fftSize; |
| uint16 minBreak; |
| uint16 maxBreak; |
| uint16 aveBreak; |
| uint16 pulsePerSec; |
| bool hookFlashDet; |
| uint16 hookFlashDuration; |
| bool disconnectDet; |
| } VpTestResultKeyType; |
| |
| /* Definitions used for VP_TEST_SNR_QDIST */ |
| typedef struct { |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| int16 amp; |
| bool useBuffer; |
| } VpTestSnrQDistorType; |
| |
| typedef struct { |
| uint16 vrmsNoise; |
| uint16 vrmsSignal; |
| } VpTestResultSnrQDistorType; |
| |
| /* Definitions used for VP_TEST_ARB_1TONE */ |
| typedef struct { |
| uint16 timeout; |
| uint16 fftSize; |
| uint16 threshold; |
| bool useBuffer; |
| } VpTestArb1ToneType; |
| |
| /* Definitions used for VP_TEST_DIALTONE */ |
| typedef struct { |
| bool inward; |
| uint16 timeout; |
| uint16 detectGran; |
| uint16 threshold; |
| uint16 fftSize; |
| uint16 duration; |
| bool useBuffer; |
| } VpTestDialToneType; |
| |
| typedef struct { |
| uint16 rmsPwr; |
| uint16 highFreq; |
| uint16 highAmp; |
| uint16 secFreq; |
| uint16 secAmp; |
| uint16 thdFreq; |
| uint16 thdAmp; |
| } VpTestResultToneType; |
| |
| /**< The following types are for GR909 tests */ |
| /* Definitions used for */ |
| typedef struct { |
| bool testFail; |
| bool acFault; |
| bool dcFault; |
| uint16 acVolt; |
| int16 dcVolt; |
| } VpTestResultGR909EmfType; |
| |
| /* Definitions used for VP_TEST_ID_GR909_RES_FLT */ |
| typedef struct { |
| bool testFail; |
| bool rtrFlt; |
| bool rtgFlt; |
| bool rrgFlt; |
| uint16 rtr; |
| uint16 rtg; |
| uint16 rrg; |
| } VpTestResultGR909ResFltType; |
| |
| /* Definitions used for VP_TEST_ID_GR909_OFF_HOOK */ |
| typedef struct { |
| bool offHook; |
| } VpTestResultGR909OffHookType; |
| |
| /* Definitions used for VP_TEST_ID_GR909_RINGERS */ |
| typedef struct { |
| bool testFailed; |
| bool renHigh; |
| bool renLow; |
| uint16 ren; |
| } VpTestResultGR909RenType; |
| |
| /* Definitions used for VP_TEST_ID_GR909_ALL */ |
| typedef struct { |
| bool testFailed; |
| bool hvFailed; |
| bool emfFailed; |
| bool resFailed; |
| bool offHook; |
| bool ringersFailed; |
| } VpTestResultGR909AllType; |
| |
| /* Definitions used for VP_TEST_ID_RAMP_INIT */ |
| typedef struct { |
| int16 dcVstart; |
| int16 dcVend; |
| int16 vRate; |
| int16 bias; |
| VpTestTipSelectType tip; |
| } VpTestRampInitType; |
| |
| /* Definitions used for VP_TEST_ID_RAMP */ |
| typedef struct { |
| int16 dcVoltage; |
| int16 vRate; |
| int16 bias; |
| VpTestTipSelectType tip; |
| } VpTestRampType; |
| |
| typedef struct { |
| int16 imt; |
| int16 vRate; |
| } VpTestResultRampType; |
| |
| /* Definitions used for VP_TEST_ID_MONITOR_IV */ |
| typedef enum { |
| VP_TEST_TYPE_DC = 0, |
| VP_TEST_TYPE_AC = 1, |
| VP_TEST_TYPE_ACDC_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpMonitorIvFilterType; |
| |
| typedef enum { |
| VP_TEST_MEAS_VA = 0, |
| VP_TEST_MEAS_VB = 1, |
| VP_TEST_MEAS_VAB = 2, |
| VP_TEST_MEAS_IMT = 3, |
| VP_TEST_MEAS_ILG = 4, |
| VP_TEST_MEAS_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpMonitorIvTestMeasurementType; |
| |
| typedef struct { |
| bool calMode; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpMonitorIvFilterType filterType; /* Measurement Type (AC/DC) */ |
| VpMonitorIvTestMeasurementType measurement; /* measurement source */ |
| } VpTestMonitorIvType; |
| |
| /* Definitions used for VP_TEST_ID_UNBAL_TONE */ |
| typedef struct { |
| uint16 freq; |
| int16 vTestlevel; |
| int16 vTipBias; |
| int16 vRingBias; |
| uint16 duration; |
| VpTestTipSelectType tip; |
| } VpTestUnbalToneType; |
| |
| /* Definitions used for VP_TEST_ID_PCM_COLLECT */ |
| typedef struct { |
| uint16 sampleTime; |
| } VpTestPcmCollectType; |
| |
| typedef struct { |
| uint16 resultsSize; |
| uint16 samples; |
| VpOptionCodecType codec; |
| uint16 reserved; |
| uint32 address; |
| } VpTestResultPcmCollectType; |
| |
| /* Definitions used for VP_FLT_DSCRM */ |
| typedef struct { |
| int16 vtgFeed; |
| int16 vrgFeed; |
| int16 vtrFeed; |
| int16 vtrAC; |
| int16 vtoAC; |
| int16 vroAC; |
| int16 vtuBalAC; |
| int16 vruBalAC; |
| bool hookDet; |
| bool gnkDet; |
| } VpTestResultFltDscrmType; |
| |
| /* Definitions for VP_TEST_ID_GEN_TEST */ |
| /* Generic Test Defines */ |
| typedef enum { |
| VP_TEST_FILTER_UNDEFINED = 0, |
| VP_TEST_FILTER_LPF = 1, |
| VP_TEST_FILTER_HPF = 2, |
| VP_TEST_FILTER_NONE = 3, |
| VP_TEST_FILTER_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestGenFilterType; |
| |
| typedef enum { |
| VP_TEST_DRIVE_UNDEFINED = 0, |
| VP_TEST_DRIVE_NONE = 1, |
| VP_TEST_DRIVE_A = 2, |
| VP_TEST_DRIVE_B = 3, |
| VP_TEST_DRIVE_BOTH = 4, |
| VP_TEST_DRIVE_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestGenDriveType; |
| |
| typedef enum { |
| VP_TEST_SIGNAL_UNDEFINED = 0, |
| VP_TEST_SIGNAL_A = 1, |
| VP_TEST_SIGNAL_B = 2, |
| VP_TEST_SIGNAL_CM = 3, |
| VP_TEST_SIGNAL_DIFF = 4, |
| VP_TEST_SIGNAL_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestGenSignalType; |
| |
| typedef enum { |
| VP_TEST_MEAS_UNDEFINED = 0, |
| VP_TEST_MEAS_LOW_GAIN = 1, |
| VP_TEST_MEAS_NORM_GAIN = 2, |
| VP_TEST_MEAS_HIGH_GAIN = 3, |
| VP_TEST_MEAS_SKIP = 4, |
| VP_TEST_MEAS_IMT_NORM_GAIN = 5, |
| VP_TEST_MEAS_IMT_HIGH_GAIN = 6, |
| VP_TEST_MEAS_VAB_LOW_GAIN = 7, |
| VP_TEST_MEAS_VAB_NORM_GAIN = 8, |
| VP_TEST_MEAS_VAB_HIGH_GAIN = 9, |
| VP_TEST_MEAS_ILG_NORM_GAIN = 10, |
| VP_TEST_MEAS_ILG_HIGH_GAIN = 11, |
| VP_TEST_MEAS_GEN_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpTestGenGainType; |
| |
| typedef struct { |
| VpTestGenFilterType filter; |
| VpTestMathType type; |
| VpTestGenDriveType driveMode; |
| VpTestGenSignalType signalMode; |
| int16 vTestLevel; |
| uint16 freq; |
| int16 vTipBias; |
| int16 vRingBias; |
| uint16 integrateTime; /* Integration time in units of 125us */ |
| uint16 settlingTime; /* Filter settling time in units of 125us */ |
| VpTestGenGainType iaMeas; |
| VpTestGenGainType vaMeas; |
| VpTestGenGainType ibMeas; |
| VpTestGenGainType vbMeas; |
| } VpTestGenTestType; |
| |
| typedef struct |
| { |
| int16 iaReal; |
| int16 iaImag; |
| int16 vaReal; |
| int16 vaImag; |
| int16 ibReal; |
| int16 ibImag; |
| int16 vbReal; |
| int16 vbImag; |
| } VpTestResultGenTestType; |
| |
| /* Definitions for Test results */ |
| typedef union { |
| bool hstatus; |
| int16 sVout; |
| uint16 uVout; |
| int16 vcm; |
| uint16 vrms; |
| VpTestResultVxcType vxc; |
| VpTestResultDcRlType dcvab; |
| VpTestResultAcRlType acimt; |
| VpTestResultAcRlPhaseType acimtp; |
| VpTestResultVixType vix; |
| VpTestResultResType res; |
| VpTestResultAltResType resAlt; |
| VpTestResultMSockType mSock; |
| VpTestResultXConnectType xConnect; |
| VpTestResultAltCapType capAlt; |
| VpTestResultCapType cap; |
| VpTestResultKeyType keypad; |
| VpTestResultSnrQDistorType snrqd; |
| VpTestResultToneType tone; |
| VpTestResultRenType ren; |
| VpTestResultLoopCondType loopCond; |
| VPTestResultLoopbackType loopback; |
| |
| bool calFailed; |
| bool ringTripFail; |
| bool loopFnd; |
| bool loopBackTestFail; |
| VpTestResultLineImpdType lineImpedance; |
| VpTestResultGR909EmfType emf; |
| VpTestResultGR909ResFltType resFault; |
| VpTestResultGR909OffHookType offHookFault; |
| VpTestResultGR909RenType ringers; |
| VpTestResultGR909AllType gr909All; |
| VpTestResultRampType ramp; |
| VpTestResultPcmCollectType pcmCollect; |
| VpTestResultFltDscrmType fltDscrm; |
| VpTestResultGenTestType gen; |
| VpTestResultSRenType sren; |
| } VpTestResultsUnionType; |
| |
| typedef struct { |
| VpTestIdType testId; /* Test identifier */ |
| VpTestStatusType errorCode; /* Error code if Test Failed */ |
| VpTestResultsUnionType result; /* Return Results Union */ |
| } VpTestResultType; |
| |
| /* The following enum is used for event associated with VpSelfTest() */ |
| typedef enum |
| { |
| VP_STEST_SUCCESS = 0, |
| VP_STEST_FAIL = 1, |
| VP_STEST_ENUM_SIZE = FORCE_STANDARD_C_ENUM_SIZE /* Portability Req.*/ |
| } VpSelfTestResultIdType; |
| |
| #endif /* VP_API_TEST_H */ |
