| #include <diags.h> |
| #include "tests.h" |
| |
| extern int Comcerto_ddr_test(struct diags_test_param *p); |
| extern int Comcerto_pfe_test(struct diags_test_param *p); |
| extern int Comcerto_tz_test(struct diags_test_param *p); |
| extern int Comcerto_dect_test(struct diags_test_param *p); |
| extern int comcerto_pcie_ep_test(struct diags_test_param *p); |
| extern int comcerto_pcie_rc_test(struct diags_test_param *p); |
| extern int comcerto_pcie_perf_test(struct diags_test_param *p); |
| extern int Comcerto_fast_uart_test(struct diags_test_param *p); |
| extern int Comcerto_nor_test(struct diags_test_param *p); |
| extern int Comcerto_zds_tdm_test(struct diags_test_param *p); |
| extern int Comcerto_zds_slic_test(struct diags_test_param *p); |
| extern int zds_init(void); |
| extern int c2k_zds_init(void); |
| extern int Comcerto_spi_test(struct diags_test_param *p); |
| extern int Comcerto_msif_tdm_test(struct diags_test_param *p); |
| extern int Comcerto_msif_slic_test(struct diags_test_param *p); |
| extern int Comcerto_i2c_test(struct diags_test_param *p); |
| extern int Comcerto_otp_test(struct diags_test_param *p); |
| extern int Comcerto_usb3_test(struct diags_test_param *p); |
| extern int Comcerto_usb3_phy_ber_test(struct diags_test_param *p); |
| extern int Comcerto_util_ipsec_test(struct diags_test_param *p); |
| extern int Comcerto_nand_ecc_test(struct diags_test_param *p); |
| extern int Comcerto_sata_test(struct diags_test_param *p); |
| |
| /* Diagnostic commands */ |
| struct diags_tests test_list[] = { |
| #ifdef CONFIG_COMCERTO_TEST_UTILPE_IPSEC |
| { CMDID_UTILPE_IPSEC, CMD_UTILPE_IPSEC, &Comcerto_util_ipsec_test, NULL, DESCR_CM_UTILPE_IPSEC, USAGE_CM_UTILPE_IPSEC, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DDR |
| { CMDID_DDR, CMD_DDR, &Comcerto_ddr_test, NULL, DESCR_CM_DDR, USAGE_CM_DDR}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_PFE |
| { CMDID_PFE, CMD_PFE, &Comcerto_pfe_test, NULL, DESCR_CM_PFE, USAGE_CM_PFE}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_TZ |
| { CMDID_TZ, CMD_TZ, &Comcerto_tz_test, NULL, DESCR_CM_TZ, USAGE_CM_TZ}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_L2CC |
| { CMDID_L2CC, CMD_L2CC, &Comcerto_l2cc_test, &Comcerto_l2cc_init, DESCR_CM_L2CC, USAGE_CM_L2CC, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DECT |
| { CMDID_DECT, CMD_DECT, &Comcerto_dect_test, NULL, DESCR_CM_DECT, USAGE_CM_DECT}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DUALCORE |
| { CMDID_DUALCORE, CMD_DUALCORE, &Comcerto_dualcore_test, NULL, DESCR_CM_DUALCORE, USAGE_CM_DUALCORE, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_PCIE |
| { CMDID_PCIE_RC, CMD_PCIE_RC, &comcerto_pcie_rc_test, NULL, DESCR_CM_PCIE_RC, USAGE_CM_PCIE_RC, 0}, |
| { CMDID_PCIE_EP, CMD_PCIE_EP, &comcerto_pcie_ep_test, NULL, DESCR_CM_PCIE_EP, USAGE_CM_PCIE_EP, 0}, |
| { CMDID_PCIE_PERF, CMD_PCIE_PERF, &comcerto_pcie_perf_test, NULL, DESCR_CM_PCIE_PERF, USAGE_CM_PCIE_PERF, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_FUART |
| { CMDID_FUART, CMD_FUART, &Comcerto_fast_uart_test, NULL, DESCR_CM_FUART, USAGE_CM_FUART}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_NOR |
| { CMDID_NOR, CMD_NOR, &Comcerto_nor_test, NULL, DESCR_CM_NOR, USAGE_CM_NOR}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_ZDSTDM |
| { CMDID_ZDSTDM, CMD_ZDSTDM, &Comcerto_zds_tdm_test, &zds_init, DESCR_CM_ZDSTDM, USAGE_CM_ZDSTDM, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_ZDS_SLIC |
| { CMDID_ZDS_SLIC, CMD_ZDS_SLIC, &Comcerto_zds_slic_test, &c2k_zds_init, DESCR_CM_ZDS_SLIC, USAGE_CM_ZDS_SLIC}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_SPI |
| { CMDID_SPI, CMD_SPI, &Comcerto_spi_test, NULL, DESCR_CM_SPI, USAGE_CM_SPI}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_MSIF_TDM |
| { CMDID_MSIF_TDM, CMD_MSIF_TDM, &Comcerto_msif_tdm_test, NULL, DESCR_CM_MSIF_TDM, USAGE_CM_MSIF_TDM, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_MSIF_SLIC |
| { CMDID_MSIF_SLIC, CMD_MSIF_SLIC, &Comcerto_msif_slic_test, NULL, DESCR_CM_MSIF_SLIC, USAGE_CM_MSIF_SLIC}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_I2C |
| { CMDID_I2C, CMD_I2C, &Comcerto_i2c_test, NULL, DESCR_CM_I2C, USAGE_CM_I2C, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_OTP |
| { CMDID_OTP, CMD_OTP, &Comcerto_otp_test, NULL, DESCR_CM_OTP, USAGE_CM_OTP, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_USB3 |
| { CMDID_USB3, CMD_USB3, &Comcerto_usb3_test, NULL, DESCR_CM_USB3, USAGE_CM_USB3, 0}, |
| { CMDID_USB3_PHY_BER, CMD_USB3_PHY_BER, &Comcerto_usb3_phy_ber_test, NULL, DESCR_CM_USB3_PHY_BER, USAGE_CM_USB3_PHY_BER, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_NAND_ECC |
| { CMDID_NAND_ECC, CMD_NAND_ECC, &Comcerto_nand_ecc_test, NULL, DESCR_CM_NAND_ECC, USAGE_CM_NAND_ECC, 0}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_SATA |
| { CMDID_SATA, CMD_SATA, &Comcerto_sata_test, NULL, DESCR_CM_SATA, USAGE_CM_SATA, 0}, |
| #endif |
| }; |
| |
| struct diags_test_param test_param_list[] = { |
| #ifdef CONFIG_COMCERTO_TEST_UTILPE_IPSEC |
| { CMDID_UTILPE_IPSEC, 1, {UTIL_IPSEC_OUT_POLL |UTIL_IPSEC_IN_POLL | UTIL_IPSEC_OUT_INTR|UTIL_IPSEC_IN_INTR }}, |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DDR |
| { CMDID_DDR, 3, { 256*1024*1024, 256*1024*1024, MEMTEST_ADDRBUS|MEMTEST_DATABUS|MEMTEST_PATTERN_AA|MEMTEST_PATTERN_55}} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_PFE |
| { CMDID_PFE, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_TZ |
| { CMDID_TZ, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_L2CC |
| { CMDID_L2CC, 1, { L2CCTEST_INVALIDATE_BY_WAY|L2CCTEST_INVALIDATE_BY_LINE|L2CCTEST_CLEAN_BY_WAY| L2CCTEST_CLEAN_BY_LINE|L2CCTEST_LOCK_BY_LINE }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DECT |
| { CMDID_DECT, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_DUALCORE |
| { CMDID_DUALCORE, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_FUART |
| { CMDID_FUART, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_NOR |
| { CMDID_NOR, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_ZDSTDM |
| { CMDID_ZDSTDM, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_ZDS_SLIC |
| { CMDID_ZDS_SLIC, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_SPI |
| { CMDID_SPI, 0, { SPI_WRITE_TEST | SPI_WRITE_READ_TEST | SPI_READ_TEST | SPI_EEPROM_READ_TEST, SPI_DEVICE_RW_ADDR, SPI_DEVICE_RW_LEN}} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_MSIF_TDM |
| { CMDID_MSIF_TDM, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_MSIF_SLIC |
| { CMDID_MSIF_SLIC, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_I2C |
| { CMDID_I2C, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_OTP |
| { CMDID_OTP, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_USB3 |
| { CMDID_USB3, 0, { 0 }} , |
| { CMDID_USB3_PHY_BER, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_NAND_ECC |
| { CMDID_NAND_ECC, 0, { 0 }} , |
| #endif |
| #ifdef CONFIG_COMCERTO_TEST_SATA |
| { CMDID_SATA, 0, { 0 }} , |
| #endif |
| }; |
| |
| unsigned int test_list_size = sizeof (test_list) / sizeof (struct diags_tests); |
