commit | ee3f9f3837bce5f9a2641ede08d3b97f6d5f7b03 | [log] [tgz] |
---|---|---|
author | Jouni Malinen <jouni@qca.qualcomm.com> | Fri Nov 28 16:54:31 2014 +0200 |
committer | Jouni Malinen <j@w1.fi> | Fri Nov 28 23:02:29 2014 +0200 |
tree | 3de816d1eb0c67f85e27fbf86ba34bd7bab4d8db | |
parent | 5a631ad2c2ecd0143d2137fc6086d3c82129e063 [diff] |
tests: Optimize autogo test cases by removing unnecessary scans Keep full channel scans in autogo for test coverage, but use single channel scan in all other autogo* test cases to remove unnecessary waiting that does not add any test coverage. This removes more than one minute from the total test execution time. Signed-off-by: Jouni Malinen <jouni@qca.qualcomm.com>